Activity Leader

Dr. Peter A. Van Aken
Max-Planck-Institut für Metallforschung, Stuttgart
Heisenbergstraße 3
DE-70569 STUTTGART
GERMANY
Phone + 49 711 689 3529
Fax     + 49 711 689 3522
E-mail:  vanaken@mf.mpg.de
Website: www.mf.mpg.de

 


TA7

 

The Microscopy Facility of the Max Planck Institute offers access to two highly sophisticated and unique electron microscopes:

 

  • a Jeol high voltage electron microscope (ARM) operating at energies up to 1250 kV. This is the only high resolution, high voltage instrument in Europe. It has an ultimate resolution of 0.1 nm with large tilting capabilities and temperature variation between 110K and 1200K.
  • a newly developed SESAM (Sub eV Sub Angstrom microscope) instrument operating at 200 kV. This instrument has an electrostatic monochromator as well as an in column energy filter of the“mandoline” type, unique in the world.

 

 

The StEM operates a number of transmission electron microscopes, two of which offer unique research opportunities and have therefore been selected as Transnational Access facilities within the ESTEEM network.

 


 JEOL ARM 1250

 

A high-voltage TEM operating at 1250 kV. It is equipped with a LaB6 electron source, a drift compensation system, video and plan film recording, etc. Its rather wide pole piece gap and the availability of heating- and cooling holders allow in-situ experiments to be performed with atomic resolution (1.1Å point resolution).

 

STU JEOL ARM 1250.jpg

 

Zeiss SESAM: A 200 kV FEG-TEM

 

equipped with a monochromator and a high-transmissivity in-column MANDOLINE energy filter. The excellent mechanical and energy stabilityof this instrument allows high-resolution electron energy-loss spectroscopy (EELS) experiments to be recorded on CCD, video, plan film, or imaging plates at high spatial resolution and with an energy resolution of 0.1eV or better.


 

STU SESAM.jpg