Activity Leader
Prof.  Dr. Hannes Lichte
Institute of Structure Physics
Triebenberg Laboratory
Technische Universität Dresden
DE-01062 DRESDEN
GERMANY
Phone + 49 351 2150 8910
Fax     + 49 351 2150 8920
E-mail: Hannes.Lichte@Triebenberg.de  
Web site: www.Triebenberg.de
TA6

 

The TUD-ISP laboratory of the University of Dresden is highly oriented towards electron holography and mapping of nanofields in transmission electron microscopy. The laboratory has specially been designed to be minimize electromagnetic, mechanical, acoustic and thermal influence on the experiments. This provides outstanding performances to the instruments. 
The laboratory offers access to the following transmission electron microscopes:

 

  • a Philips CM30FEG/UT for ultimate resolution
  • a Philips CM200FEG/ST Lorentz, specially for magnetic materials
  • FEI Tecnai-F20 ST/Cs allowing aberration corrections up to the 3rd order.

TEM FEI Tecnai F20/Cs-Corrected

 

DRE 1.jpg 

 

Specifications:
Acceleration Voltage: 200kV, Schottky Field-Emission Gun
Point Resolution: 0.12 nm, Information Limit: 0.12 nm
Corrector for Spherical Aberration (Cs)
Möllenstedt Biprism
1k Slow-Scan CCD-Camera (Gatan Company)
on-line Image Processing and Analysis
Applications:
Aberration-Free High-Resolution TEM
Aberration-Free High-Resolution Electron Holography

 

 

TEM Philips CM30FEG UT/Special Tübingen

 

DRE2.jpg 

 

Specifications:
Acceleration Voltage: 300kV, Schottky Field-Emission Gun
Point Resolution: 0.17 nm, Information Limit: 0.09 nm
Möllenstedt Biprism
2k Slow-Scan CCD-Camera (Tietz/Photometrics Company)
on-line Image Processing and Analysis
Applications:
High-Resolution TEM
High-Resolution Electron Holography

 

 

TEM Philips CM200FEG ST/Lorentz

 

DRE3.jpg 

 

Specifications:
Acceleration Voltage: 200kV, Schottky Field-Emission Gun
Point Resolution: 0.24 nm, Information Limit: 0.12 nm
Lorentz-Lens
rotatable Möllenstedt Biprism
1k Slow-Scan CCD-Camera (Gatan Company)
PEELS (Parallel Electron Energy Loss Spectrometer)
on-line Image Processing and Analysis
Applications:
High-Resolution TEM
Holographic imaging of electric potentials and magnetic fields in nanometer domain


 

TEM Philips EM420 T

 

DRE4.jpg 

 

Specifications:
Acceleration Voltage: 120kV, Tungsten-Emitter
Information Limit (to be tested)
1k Slow-Scan CCD-Camera (to be mounted, Tietz/Photometrics Company)
Applications:
Test of new samples
Test of new biprisms
Test of new emitters and wave optical elements