This activity is aimed at overcoming the current need for improved detection in electron microscopy. The first project aims to upgrade a former developed device to provide increased sensitivity of the detector chain. It incorporates a back-thinned CCD for improved resolution and sensitivity. The second project involves the development of a new detector that will directly detect the incident electrons. The active portion of the new detector is related to silicon strip detectors, fabricated on a thin membrane of silicon with a pitch between the strips of only 10-20mm.