Technische Universiteit Delft


The Centre for High Resolution Electron Microscopy was founded in 1989 with financial support from Delft University of Technology, the Foundation for Fundamental Research of Matter (FOM), the Foundation of Chemical Research (SON), the Ministry of Economic Affairs, and the Ministry of Education.


At the moment the Centre has three electron microscopes, which are described in this guide. The microscopes and auxiliary equipment may be used by researchers of other research groups.
The Centre is part of the research group Physical Chemistry of the Solid State.


In addition to the electron microscopes described here the group is also equipped with advanced facilities for X-ray diffraction and surface analysis (EPMA, SAM, XPS, SEM). The focus of research concentrates on the relation between the properties and structural imperfections of materials. In this respect the electron microscopic research of the group involves the following subjects: structure of grain boundaries and interfaces in semiconductors, ordered alloys and superconductors, and phase transformations in multilayer alloys and steels. The microscopes may be used by other research groups of Delft University of Technology as well as by industries and other universities; in some cases these investigations are performed by staff members of the Centre.