The Department of Materials has a long and distinguished record of research in Electron Microscopy and Microanalysis, especially in the areas of technique development, defect analysis and high resolution microscopy. In addition, electron microscopy and microanalysis are an integral part of many research activities of other groups in the Department, including processing, polymers and ceramics, and there is a strong interaction with the modelling group.
In recent years the EM&M Group has undergone major growth, including expansion into the Begbroke site and the installation of the world's only double aberration-corrected TEM/STEM. The group has two Professors (Cockayne and Kirkland) and two Readers (Hutchison and Jenkins) and is expanding into new research areas, and seeking collaborations. It has a well-developed formal and informal postgraduate training programme, in modular form, and a seminar series. It holds a Platform Grant, which provides staff (Hetherington and Huang) to give research leadership in a range of high resolution microscopy and spectroscopy techniques and in FIB and sample fabrication. An innovative schools outreach programme has a remotely accessible SEM (Oxford CyberSEM), supported by modules aimed at the school curriculum. Collaborations with JEOL through the JEOL Applications Laboratory at the Begbroke Site of the University involve the new aberration corrected FEG(S)TEM and the remote microscopy project.